PARTICLE SIZE AND STRAIN FROM X-RAY PEAK PROFILE ANALYSIS (XPPA) OF Mg DOPED TiO2 THIN FILM ........

Sol-gel method is used to make a Mg doped TiO2 micro thick layer. For a micron thick (0.9018 m) Mg doped TiO2 thick film, X-ray peak profile analysis (XPPA) is performed. X-ray diffraction investigation reveals that the material is crystalline and in the tetragonal phase. The crystallite formation in Mg doped TiO2 nanoparticles is studied using XPPA. Using the size-strain plot (SSP) approach, the effect of crystallite size and lattice strain on the peak broadening of the analysed sample is investigated. The different microstructural parameters for all of the xrd reflection peaks for the entire diffraction range (2= 10° - 90°) are estimated, and it is seen that the results obtained by SSP method and Scherrer's formula are very similar and comparable with negligible deviation, indicating that they are in good agreement.

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