ROLE OF SOLUTION CONCENTRATION ON ZnO THIN FILMS PREPARED BY SILAR METHOD | Journal of Applied ....

Low cost SILAR coating technology has been used to successfully coat Zinc Oxide (ZnO) thin films onto glass substrates at various solution concentrations. The film thickness was calculated using the weight gain method, and the results showed that the film thickness grew as solution concentration values rose. X-ray diffraction (XRD), scanning electron microscope (SEM), and UV-Vis-NIR spectrophotometer were used to investigate the structural, morphological, optical, and electrical properties of the produced film. The films' structure was discovered to be hexagonal in nature, polycrystalline in nature, and oriented preferentially along the (002) plane. Micro structural characteristics such as crystallite size, micro strain, dislocation density, and stacking fault likelihood were evaluated using X-ray line profile analysis. The crystallite size values rose as the solution concentration values increased, with the highest crystallite size calculated to be 29.23 nm at a concentration of 0.3 M. The concentration of the solution has a significant effect on the morphology of the ZnO thin films, according to the morphological data. The band gap can be customised between 3.2 eV and 3.6 eV by changing the solution concentration, according to the optical studies. Zinc and oxygen content were discovered in EDAX investigations.

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